BM3110 Electronic Instrumentation · Lecture 1 of 7

Noise and Interference in Instrumentation — Part 1: Introduction

University of Moratuwa · Dept. of Biomedical Engineering · Semester 5 · Fall 2026 · 42 slides
where noise comes frommodelling noisy devices (1-port & 2-port)RMS, mean & power spectral densitywhen noise powers addnoise through a frequency-dependent systemnoise figure
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This opening lecture sets up the toolkit that Part 2 builds on: how to represent noise sources in a circuit, how to quantify them, when it's valid to simply add them together, how they propagate through a frequency-dependent system, and how to compare a system's own noise contribution against a standard reference.

1. Where noise comes from

Modeling noise this way — rather than treating it as an unstructured nuisance — enables design optimization: informed source/load matching, component choice, filtering and bandwidth decisions, and a realistic uncertainty floor for measurements.

2. Modeling a noisy device

For a simple two-terminal (1-port) device — a resistor, a non-ideal capacitor or inductor, a diode, a battery — the noise it generates can be modeled with a single source applied to an otherwise ideal, noiseless version of the device:

Real device that generates noise (e.g. resistor, diode, non‑ideal capacitor) Modelled as (OR) Ideal noiseless device in series with vₙ(t) Ideal noiseless device in parallel with iₙ(t)
Fig. 1 — A noisy 1-port device modelled as a Thevenin (series voltage) or Norton (parallel current) equivalent (redrawn from the lecture slides)

The two forms are equivalent (Thevenin ↔ Norton), but one is often more convenient depending on the device: a series voltage source suits a resistor, while a diode's current-driven physics often makes a current source the more natural choice.

3. Multi-terminal devices: the input-referred noise model

A 3- or 4-terminal (2-port) device — a transistor, an op-amp — can't be modeled with a single noise source: a BJT alone has separate noise contributions from its base, base–emitter junction and collector–emitter junction, and every device topology places them differently. Rather than track each source individually, every noise source inside the 2-port device is collapsed into one equivalent series voltage source AND one parallel current source at the input — the input-referred noise model. This lets noise calculations proceed agnostic to whatever is actually inside the device.

4. Quantifying noise: RMS, mean, variance and PSD

Noise voltage/current has zero mean by definition — so the quantity that actually matters is its power, via the RMS value. But real systems only ever pass a limited band of frequencies, so noise power needs a frequency-resolved description: the power spectral density (PSD), the average noise power measured through a very narrow bandpass filter centered at each frequency, normalized per Hz of bandwidth.

Total noise power in a band [fL, fH] Ptotal = ∫fLfH S(f) df   —   flat (white) PSD: P = S·(fH−fL) = S·B

This is exactly why Part 2's thermal-noise formulas multiply a flat PSD by a bandwidth Δf to get a power: it's this integral, simplified for the white-noise case.

5. When can noise powers simply add?

Not automatically. Writing the instantaneous power of two combined noise voltages through a resistance R and averaging over time produces a cross term alongside the two individual power terms:

Average combined noise power PAVG = P1,AVG + P2,AVG + (2/T)∫v1(t)v2(t) dt

That cross term vanishes — leaving the simple PAVG = P1,AVG+P2,AVG rule used throughout Part 2 — only when the two sources are genuinely independent (their instantaneous product averages to zero over time). When sources are correlated, the cross term survives and the simple sum under-counts the true noise power.

Real-world example: two amplifiers powered from the same noisy supply rail each inherit a copy of that rail's ripple noise. Their own intrinsic noise sources are independent of each other, but both outputs share the same ripple term (scaled by each amplifier's own PSRR) — so that shared component is correlated, and can't just be summed as an independent power term the way each amplifier's intrinsic noise can.

6. Noise through a frequency-dependent system

A linear system with transfer function H(f) scales a noise PSD at its input by the squared magnitude of the transfer function:

Output PSD through a linear system Sout(f) = |H(f)|2·Sin(f)

Worked example: thermal noise from a resistor R (white PSD Sin) filtered by its own RC low-pass network, |H(f)|² = 1/(1+(2πfRC)²).

Pout,AVG = ∫0∞ Sin/(1+(2πfRC)²) df = Sin·π/(2RC)

Rewriting in terms of the filter's actual −3 dB cutoff f−3 = 1/(2πRC):

Pout,AVG = Sin × (π/2)·f−3

So a real (rounded-off) filter passes exactly as much noise power as an ideal "brick-wall" filter whose width — the effective noise bandwidth — is π/2 times the filter's own −3 dB cutoff frequency, not the cutoff frequency itself. This equal-area argument is why a filter's noise bandwidth is always somewhat wider than its "advertised" 3 dB bandwidth would suggest.

7. Noise figure: comparing against a standard reference

To judge how much noise a system itself adds — independent of whatever noise its input signal already carries — every source resistance is assigned a standardized reference noise, using a fixed reference temperature T0 = 290 K (the maximum available thermal noise power a source resistance can deliver, by the maximum power transfer theorem):

Standardized reference noise & noise factor PN,ref = kBT0Δf   —   F = 1 + (excess input‑referred noise power)/(kBT0Δf)

The noise factor F is independent of the input signal itself and depends only on the system's intrinsic noise characteristics — which is what makes it a fair way to compare the noise performance of two different systems. Expressed in decibels, NF = 10log10(F).

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